BadgerFilm

BadgerFilm performs nondestructive quantitative analysis of thin films, substrates, and bulk specimens by processing electron probe microanalysis (EPMA) data with a ϕ(ρz) ionization depth model to enable accurate elemental quantification.

Key Features:

• ϕ(ρz) model implementation: Employs a documented ϕ(ρz) model to simulate ionization depth distributions within thin films and substrates.
• Absolute X-ray intensity calculation: Calculates absolute X-ray intensities for direct quantitative comparison with Monte Carlo simulations.
• Matrix correction procedures: Uses simulated ionization distributions to perform matrix correction procedures for elemental quantification.
• Elemental quantification of layered specimens: Determines elemental compositions in thin films, substrates, and bulk specimens.
• Validation against simulations and data: Validates computational results through comparison with Monte Carlo simulations and experimental measurements.

Scientific Applications:

• Layered materials characterization: Quantifies composition and depth-dependent ionization in layered specimens and thin films.
• Materials science and nanotechnology: Supports fundamental studies of material properties in materials science and nanotechnology.
• Bioengineering: Enables compositional analysis of thin-film materials used in bioengineering research.
• Applied thin-film development: Supports applied research and development of thin-film technologies through accurate compositional analysis.

Methodology:

Processes EPMA data and implements a ϕ(ρz) model to simulate ionization depth distributions used in matrix correction procedures, with outputs compared to Monte Carlo simulations and experimental data.