BINoculars

BINoculars reduces and analyzes large two-dimensional X-ray detector datasets from surface diffraction experiments by projecting pixel intensities into reciprocal-lattice coordinates to enable reciprocal-space analysis.

Key Features:

• Data reduction via binning algorithm: Projects intensity data from each pixel of a two-dimensional detector onto a three-dimensional grid in reciprocal-lattice coordinates, reducing dataset size while preserving resolution.
• Reciprocal space analysis: Enables detailed interpretation of surface diffraction patterns within reciprocal space.
• Modular design and beamline compatibility: Modular framework allows adaptation to different beamlines and measurement techniques, including workflows developed for the ID03 beamline of the European Synchrotron Radiation Facility (ESRF).

Scientific Applications:

• Surface X-ray diffraction data processing: Streamlines processing of surface X-ray diffraction measurements to obtain high-resolution intensity distributions.
• Surface structure characterization: Supports materials science investigations that require precise surface structural information from reciprocal-space analyses.

Methodology:

Uses a binning algorithm to transform raw detector pixel intensities into a structured three-dimensional grid in reciprocal-lattice coordinates, followed by reciprocal-space analysis.