Condor

Condor simulates X-ray far-field scattering amplitudes from isolated particles to predict diffraction patterns for experimental design and reconstruction algorithm development in X-ray free-electron laser (XFEL) imaging.


Key Features:

  • Far-field scattering simulation: Simulates X-ray far-field scattering amplitudes and diffraction signals from isolated particles.
  • Atomic and refractive-index models: Accepts user-defined atomic models or refractive index models to represent samples.
  • Experimental-parameter optimization: Evaluates instrument constraints to identify optimal experimental configurations.
  • Feasibility testing: Simulates proposed imaging experiments to assess viability under specified conditions.
  • Algorithm development support: Generates realistic test diffraction data for development and benchmarking of reconstruction algorithms.
  • Application to non-crystalline samples: Enables simulation of diffraction patterns without requiring crystallization, relevant for single-particle XFEL studies.

Scientific Applications:

  • High-resolution structural determination: Supports prediction of diffraction patterns for structural analysis of biological macromolecules and materials without crystallization.
  • XFEL experimental planning: Enables feasibility assessment and optimization of XFEL experiments to maximize data quality and efficient use of beam time.
  • Reconstruction algorithm benchmarking: Provides simulated diffraction datasets for testing, validation, and development of reconstruction and analysis algorithms.

Methodology:

Simulates X-ray scattering amplitudes from user-defined atomic or refractive index models of isolated particles to produce predicted far-field diffraction patterns used for experimental optimization and algorithm testing.

Topics

Details

License:
BSD-2-Clause
Tool Type:
command-line tool, web application
Operating Systems:
Linux, Windows, Mac
Programming Languages:
Python
Added:
9/3/2018
Last Updated:
12/10/2018

Operations

Publications

Hantke MF, Ekeberg T, Maia FRNC. <i>Condor</i>: a simulation tool for flash X-ray imaging. Journal of Applied Crystallography. 2016;49(4):1356-1362. doi:10.1107/s1600576716009213. PMID:27504081. PMCID:PMC4970500.

Documentation

Links