CONSENT

CONSENT performs scalable long-read self-correction and assembly polishing by combining multiple sequence alignment and local de Bruijn graph polishing to reduce ~10% error rates in Oxford Nanopore Technologies and other third-generation sequencing long reads.


Key Features:

  • Segmentation-based overlap computation: Computes overlaps between long reads using a segmentation strategy to form alignment piles for each read.
  • Windowed multiple sequence alignment: Divides alignment piles into smaller windows and derives consensus sequences by performing multiple sequence alignment within each window.
  • Local de Bruijn graph polishing: Applies local de Bruijn graphs to polish consensus sequences and reduce residual errors.
  • Assembly polishing: Polishes raw assemblies directly to improve assembly accuracy.
  • Ultra-long read scalability: Scales to ultra-long reads (reported up to 1.5 Mbp) and has been applied to large human datasets (processing example: 1.5 Mbp reads in ~10 days).
  • Comparative performance: Reported to be 2–38 times faster than other polishing tools on real Oxford Nanopore data while delivering comparable or superior results and improving assemblies produced by Flye.
  • Resource-efficient workflow: Demonstrates that assembling raw reads and then polishing the assembly can be less resource-intensive and yield better results than correcting reads prior to assembly.

Scientific Applications:

  • Genome assembly improvement: Improves the accuracy of long-read assemblies for downstream genomic analyses.
  • Structural variant detection: Increases read and assembly accuracy to support more reliable structural variant identification.
  • Complex region characterization: Enables analysis of complex genomic regions by improving continuity and correctness of ultra-long reads and assemblies.
  • Long-read sequencing data refinement: Reduces error rates in third-generation sequencing datasets, facilitating more accurate downstream interpretations.

Methodology:

Compute overlaps between long reads using a segmentation strategy to form alignment piles, split piles into windows, derive consensus sequences by multiple sequence alignment within windows, and polish these consensuses using local de Bruijn graphs.

Topics

Details

License:
AGPL-3.0
Tool Type:
command-line tool
Programming Languages:
C++, Shell
Added:
3/19/2021
Last Updated:
3/22/2021

Operations

Publications

Morisse P, Marchet C, Limasset A, Lecroq T, Lefebvre A. Scalable long read self-correction and assembly polishing with multiple sequence alignment. Scientific Reports. 2021;11(1). doi:10.1038/s41598-020-80757-5. PMID:33436980. PMCID:PMC7804095.