CONSENT
CONSENT performs scalable long-read self-correction and assembly polishing by combining multiple sequence alignment and local de Bruijn graph polishing to reduce ~10% error rates in Oxford Nanopore Technologies and other third-generation sequencing long reads.
Key Features:
- Segmentation-based overlap computation: Computes overlaps between long reads using a segmentation strategy to form alignment piles for each read.
- Windowed multiple sequence alignment: Divides alignment piles into smaller windows and derives consensus sequences by performing multiple sequence alignment within each window.
- Local de Bruijn graph polishing: Applies local de Bruijn graphs to polish consensus sequences and reduce residual errors.
- Assembly polishing: Polishes raw assemblies directly to improve assembly accuracy.
- Ultra-long read scalability: Scales to ultra-long reads (reported up to 1.5 Mbp) and has been applied to large human datasets (processing example: 1.5 Mbp reads in ~10 days).
- Comparative performance: Reported to be 2–38 times faster than other polishing tools on real Oxford Nanopore data while delivering comparable or superior results and improving assemblies produced by Flye.
- Resource-efficient workflow: Demonstrates that assembling raw reads and then polishing the assembly can be less resource-intensive and yield better results than correcting reads prior to assembly.
Scientific Applications:
- Genome assembly improvement: Improves the accuracy of long-read assemblies for downstream genomic analyses.
- Structural variant detection: Increases read and assembly accuracy to support more reliable structural variant identification.
- Complex region characterization: Enables analysis of complex genomic regions by improving continuity and correctness of ultra-long reads and assemblies.
- Long-read sequencing data refinement: Reduces error rates in third-generation sequencing datasets, facilitating more accurate downstream interpretations.
Methodology:
Compute overlaps between long reads using a segmentation strategy to form alignment piles, split piles into windows, derive consensus sequences by multiple sequence alignment within windows, and polish these consensuses using local de Bruijn graphs.
Topics
Details
- License:
- AGPL-3.0
- Tool Type:
- command-line tool
- Programming Languages:
- C++, Shell
- Added:
- 3/19/2021
- Last Updated:
- 3/22/2021
Operations
Publications
Morisse P, Marchet C, Limasset A, Lecroq T, Lefebvre A. Scalable long read self-correction and assembly polishing with multiple sequence alignment. Scientific Reports. 2021;11(1). doi:10.1038/s41598-020-80757-5. PMID:33436980. PMCID:PMC7804095.