Correlia

Correlia registers 2D multimodal microscopy datasets within ImageJ/FIJI to align light and electron micrographs with chemical maps (e.g., secondary-ion mass spectroscopy and energy-dispersive X-ray spectroscopy) across differing resolutions and fields-of-view.

Key Features:

• Multimodal Data Handling: Handles light and electron micrographs alongside chemical maps from secondary-ion mass spectroscopy and energy-dispersive X-ray spectroscopy to correlate diverse imaging modalities.
• Flexible Registration Algorithms: Provides cascaded linear and nonlinear registration methods using feature-based and area-based similarity measures for tailored alignment.
• Correction of Distortions: Corrects distortions within micrographs to enable accurate overlays despite substantial differences in field-of-view or resolution.
• Overlay of Chemical Maps: Enables overlay of chemical maps that highlight specific elements or compounds to correlate structural and compositional data.

Scientific Applications:

• Microbiology: Supports integration of multimodal imaging to visualize and analyze subcellular structures and complex biological processes.
• Chemical microscopy and materials analysis: Facilitates correlation of structural and compositional information to investigate material properties and biological interactions.

Methodology:

Applies cascaded linear and nonlinear registration algorithms sequentially or in combination, employing feature-based and area-based similarity measures with distortion correction.