darfix

darfix analyzes dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data to extract three-dimensional maps of lattice strain and orientation in materials.

Key Features:

• Data processing and visualization: Processing and visualization of DFXM and RCI datasets to extract lattice strain and orientation information.
• Python integration: Implemented in Python as a library for integration into scientific workflows.
• Scalability: Online (larger-than-memory) versions of data processing algorithms for processing large image sets.
• Metadata utilization: Automatic extraction of instrument angle settings from input file metadata.
• File format support: Supports EDF (European Data Format) input and indicates planned HDF5 support.

Scientific Applications:

• Materials science and engineering: Extraction of three-dimensional maps of lattice strain and orientation to study microstructural properties of materials.
• Semiconductor technology: Investigation of microstructural behavior relevant to semiconductor devices using DFXM and RCI data.
• Metallurgy: Analysis of crystallographic strain and orientation to study metallurgical processes and material behavior.
• Nanotechnology: Characterization of microstructural properties in nanotechnology research using DFXM and RCI imaging.

Methodology:

Uses data processing algorithms optimized for the characteristics of DFXM and RCI datasets, including online (out-of-core) algorithm implementations and automatic extraction of instrument angle settings from input file metadata, with input handling for EDF files.