FC_analysis

FC_analysis analyzes Atomic Force Microscopy (AFM) force curves and force volume maps to generate elasticity and deformability images for nanomechanical characterization of samples.

Key Features:

• Automatic Analysis: Processes single force curves and entire force volume maps to produce elasticity and deformability images.
• Adaptability: Accepts user-specified detector sensitivity, scanner-z sensitivity, cantilever elastic constant, and map acquisition modality for analysis.
• Customizable Methodologies: Supports multiple analysis methodologies with adjustable fitting parameters and stepwise control of the analysis procedure.
• Rectangular Image Analysis: Analyzes rectangular portions of images to enable localized assessment of inhomogeneous samples.
• Young’s Modulus Mapping: Reconstructs Young’s modulus maps at different penetration depths to enable force tomography.

Scientific Applications:

• Nanomechanical characterization: Quantifies elasticity, stiffness, and adhesion of biological specimens from AFM data.
• Depth-resolved profiling (force tomography): Maps mechanical properties as a function of penetration depth using Young’s modulus reconstructions.
• Localized analysis of inhomogeneous samples: Performs subregion mechanical mapping via rectangular image analysis.
• Integration with topography: Couples mechanical property maps with high-resolution topographic reconstructions for combined analysis.

Methodology:

Processes AFM force curves and force volume maps to generate elasticity and deformability images; applies detector sensitivity, scanner-z sensitivity, and cantilever elastic constant values; performs fitting with adjustable parameters across supported analysis methodologies; analyzes rectangular image regions; reconstructs Young’s modulus maps at different penetration depths (force tomography) and couples mechanical property maps with topographic reconstructions.