SerialEM

SerialEM acquires and manages tilt series on Tecnai and JEOL electron microscopes to enable high-resolution three-dimensional reconstructions while minimizing specimen radiation damage.

Key Features:

• Predictive Positioning: Uses statistical models of positional changes at previous tilt angles to predict specimen position and decide whether to skip direct focus or position measurements.
• Adaptive Acquisition Strategy: Dynamically switches between rapid acquisition without additional focusing or tracking when prediction error is low and conventional focusing/tracking when prediction reliability diminishes.
• Efficient Data Acquisition Environment: Controls acquisition parameters including energy filter use and low-dose imaging modes, allowing tracking and focusing away from the area of interest to reduce radiation damage.
• Montage Capability: Automatically acquires overlapping-frame montages to enable tomographic analysis of regions larger than the CCD camera field of view.
• Navigation and Region Identification Tools: Provides functions for navigating between specimen positions and identifying regions of interest for targeted imaging.

Scientific Applications:

• Cell Biology: Supports high-quality tomographic reconstructions for structural analysis of cellular components at the nanoscale.
• Materials Science: Enables three-dimensional tomographic analysis of material microstructures beyond the native field of view.
• Virology: Facilitates detailed structural studies of viruses through improved tilt series acquisition and reconstruction.

Methodology:

Predicts specimen movement during tilting sequences using statistical analysis of positional changes at previous angles to determine when direct focus/position measurements can be skipped, reverts to tracking/focusing when prediction error increases, and integrates energy-filter use and low-dose imaging modes.